C Type Impact Device Probe for Small Lightweight Thin Components Hardened Layers

Name: C Type Impact Device Probe for Small Lightweight Thin Components Hardened Layers
SKU: 167852651545
Price: 190.00 USD
Availability: InStock

$95.00

$190.00 -50%

Brand VTSYIQI

Condition New

Item ID 167852651545

Country of Origin	China
Brand	VTSYIQI
Type	Impact Device Probe
MPN	202510111345
UPC	607608203538

Check the listing for details. C Type Impact Device Probe for Small Lightweight Thin Components Hardened Layers. Condition: New, Made in China. Listed at 190.00 USD. C :Test small, light, thin parts and surface of hardened layer. Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test. Item model number ‏ : ‎ C type impact device. Available type of impact device.

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