| Country of Origin | China |
|---|---|
| Brand | VTSYIQI |
| Type | Impact Device |
| MPN | Impact Device |
| UPC | 658359888741 |
Check the listing for details. Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test. Condition: New, Made in China. Listed at 179.51 USD. C : Test small, light, thin parts and surface of hardened layer. Item model number : C type impact device. Available type of impact device.
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